TEM
TEM is a technique that uses an electron beam to image a nanoparticle sample, providing much higher resolution than is possible with light-based imaging techniques. TEM is the preferred method to directly measure nanoparticle size, grain size, size distribution, and morphology.
| TEM Service Price List | |
|---|---|
| 1 sample | $250 each |
| 2-4 samples | $225 each |
| 5+ samples | $200 each |
| Numerical Grain Size Analysis | |
| 100 particle histogram | $100 |
| 300 particle histogram | $200 |
At nanoComposix, we use a JEOL 1010 transmission electron microscope operating at an accelerating voltage of 100 keV and an AMT XR41-B 4-megapixel (2048 x 2048) bottom mount CCD camera. The camera’s finite-conjugate optical coupler provides high resolution and flat focus with less than 0.1% distortion for magnifications as high as 150,000x.
To take advantage of our TEM Service please contact us at service@nanocomposix.com. A nanoComposix representative will contact you within 1 business day to discuss your needs, provide suggestions, and answer your questions.